BOSTON — Teradyne Inc. here today moved to lower the cost of IC test, announcing a new line of automatic test equipment (ATE) that incorporates a flexible, modular design for a range of applications.
Building a modular test strategy can provide great flexibility in capabilities, or the system can be tailor-made for specific requirements. Often a hybrid approach encompassing traditional box ...
A version of this article also appeared in the May 2012 issue of Test & Measurement World. See the PDF. Test engineers have used open standard interfaces since1975, when the IEEE approved IEEE 488, ...